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→Detector / Signal Acronyms
| [[Back scatter Electron Detector | BSE]] || [[Back scatter Electron Detector | Back scatter Electron]] || English || Reflected electrons of about the energy of the primary beam.
| [[Back scatter Electron Detector | BSE]] || [[Back scatter Electron Detector | Back scatter Electron]] || English || Reflected electrons of about the energy of the primary beam.
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| [[Back scatter Electron Detector | RE]] || [[Back scatter Electron Detector | Reflected Electron]] || English / Germany || Older term for BSE, often used in the german language.
| [[Back scatter Electron Detector | RE]] || [[Back scatter Electron Detector | Reflected Electron]] || English / Germany || Older term for BSE, often used in the German language.
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| [[Electron Beam Diffraction | BSED ]] || [[Electron Beam Diffraction | Backscattered electron Diffraction]] || English || The Angle and crystal structure dependent reflected electrons, forming [[Kikuchi lines]].
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| [[Electron Beam Diffraction | SAD]] || [[Electron Beam Diffraction | Selected Area Diffraction ]] || English || Alternative methode of drawing Kichuchi lines by changing the entry angle of the electron beam into a fixed spot of the specimen.
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| [[Specimen Current Imaging | EBIC]] || [[Specimen Current Imaging | Electron Beam Induced Current]] || English || The electric current produced by the Primary beam.
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| [[Specimen Current Imaging | SC]] || [[[[Specimen Current Imaging | Specimen Current]] || English || Alternative term for EBIC
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