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, 12:57, 11 February 2024
Below are found some common acronyms encountered in the field of Electron Microscopy. These are somewhat grouped and listed in no particular order.
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= Detector / Signal Acronyms =
These acronyms are listed without the "D" sometimes found at the end, stating that they are detectors, so "SE" signals would be detected by a "SED" Secondary electron detector. Some Acronyms contian a "D" as their final letter, such as "BSED" which dose not mean "Back scatter Electron detector", but instead "Back scatter Electron Diffraction".
{|class="wikitable" style="margin:auto"
|+Common Signal Names
! Acronym !! Full Text !! Language !! Explanation
|-
| [[Secondary Electron Detector | SE]] || [[Secondary Electron Detector | Secondary Electron]] || English || Low energy electrons emitted from the surface (interaction volume) by impact of the primary beam.
|-
| [[Back scatter Electron Detector | BSE]] || [[Back scatter Electron Detector | Back scatter Electron]] || English || Reflected electrons of about the energy of the primary beam.
|-
| [[Back scatter Electron Detector | RE]] || [[Back scatter Electron Detector | Reflected Electron]] || English / Germany || Older term for BSE, often used in the german language.
|}