Common Acronyms
Jump to navigation
Jump to search
Below are found some common acronyms encountered in the field of Electron Microscopy. These are somewhat grouped and listed in no particular order.
Detector / Signal Acronyms
These acronyms are listed without the "D" sometimes found at the end, stating that they are detectors, so "SE" signals would be detected by a "SED" Secondary electron detector. Some Acronyms contian a "D" as their final letter, such as "BSED" which dose not mean "Back scatter Electron detector", but instead "Back scatter Electron Diffraction".
Acronym | Full Text | Language | Explanation |
---|---|---|---|
SE | Secondary Electron | English | Low energy electrons emitted from the surface (interaction volume) by impact of the primary beam. |
BSE | Back scatter Electron | English | Reflected electrons of about the energy of the primary beam. |
RE | Reflected Electron | English / Germany | Older term for BSE, often used in the German language. |
BSED | Backscattered electron Diffraction | English | The Angle and crystal structure dependent reflected electrons, forming Kikuchi lines. |
SAD | Selected Area Diffraction | English | Alternative methode of drawing Kichuchi lines by changing the entry angle of the electron beam into a fixed spot of the specimen. |
EBIC | Electron Beam Induced Current | English | The electric current produced by the Primary beam. |
SC | [[ Specimen Current | English | Alternative term for EBIC |