Common Acronyms

Below are found some common acronyms encountered in the field of Electron Microscopy. These are somewhat grouped and listed in no particular order.

Detector / Signal Acronyms

These acronyms are listed without the "D" sometimes found at the end, stating that they are detectors, so "SE" signals would be detected by a "SED" Secondary electron detector. Some Acronyms contian a "D" as their final letter, such as "BSED" which dose not mean "Back scatter Electron detector", but instead "Back scatter Electron Diffraction".

Common Signal Names

Acronym	Full Text	Language	Explanation
SE	Secondary Electron	English	Low energy electrons emitted from the surface (interaction volume) by impact of the primary beam.
BSE	Back scatter Electron	English	Reflected electrons of about the energy of the primary beam.
RE	Reflected Electron	English / Germany	Older term for BSE, often used in the German language.
BSED	Backscattered electron Diffraction	English	The Angle and crystal structure dependent reflected electrons, forming Kikuchi lines.
SAD	Selected Area Diffraction	English	Alternative methode of drawing Kichuchi lines by changing the entry angle of the electron beam into a fixed spot of the specimen.
EBIC	Electron Beam Induced Current	English	The electric current produced by the Primary beam.
SC	[[ Specimen Current	English	Alternative term for EBIC