Common Acronyms
Below are found some common acronyms encountered in the field of Electron Microscopy. These are somewhat grouped and listed in no particular order.
Detector / Signal Acronyms
These acronyms are listed without the "D" sometimes found at the end, stating that they are detectors, so "SE" signals would be detected by a "SED" Secondary electron detector. Some Acronyms contian a "D" as their final letter, such as "BSED" which dose not mean "Back scatter Electron detector", but instead "Back scatter Electron Diffraction".
| Acronym | Full Text | Language | Explanation |
|---|---|---|---|
| SE | Secondary Electron | English | Low energy electrons emitted from the surface (interaction volume) by impact of the primary beam. |
| BSE | Back scatter Electron | English | Reflected electrons of about the energy of the primary beam. |
| RE | Reflected Electron | English / Germany | Older term for BSE, often used in the german language. |