Difference between revisions of "Common Acronyms"
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(Created page with "Below are found some common acronyms encountered in the field of Electron Microscopy. These are somewhat grouped and listed in no particular order. __TOC__ = Detector / Sig...") |
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| [[Back scatter Electron Detector | BSE]] || [[Back scatter Electron Detector | Back scatter Electron]] || English || Reflected electrons of about the energy of the primary beam. | | [[Back scatter Electron Detector | BSE]] || [[Back scatter Electron Detector | Back scatter Electron]] || English || Reflected electrons of about the energy of the primary beam. | ||
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| − | | [[Back scatter Electron Detector | RE]] || [[Back scatter Electron Detector | Reflected Electron]] || English / Germany || Older term for BSE, often used in the | + | | [[Back scatter Electron Detector | RE]] || [[Back scatter Electron Detector | Reflected Electron]] || English / Germany || Older term for BSE, often used in the German language. |
| + | |- | ||
| + | | [[Electron Beam Diffraction | BSED ]] || [[Electron Beam Diffraction | Backscattered electron Diffraction]] || English || The Angle and crystal structure dependent reflected electrons, forming [[Kikuchi lines]]. | ||
| + | |- | ||
| + | | [[Electron Beam Diffraction | SAD]] || [[Electron Beam Diffraction | Selected Area Diffraction ]] || English || Alternative methode of drawing Kichuchi lines by changing the entry angle of the electron beam into a fixed spot of the specimen. | ||
| + | |- | ||
| + | | [[Specimen Current Imaging | EBIC]] || [[Specimen Current Imaging | Electron Beam Induced Current]] || English || The electric current produced by the Primary beam. | ||
| + | |- | ||
| + | | [[Specimen Current Imaging | SC]] || [[[[Specimen Current Imaging | Specimen Current]] || English || Alternative term for EBIC | ||
| + | |- | ||
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Latest revision as of 02:52, 12 February 2024
Below are found some common acronyms encountered in the field of Electron Microscopy. These are somewhat grouped and listed in no particular order.
Detector / Signal Acronyms
These acronyms are listed without the "D" sometimes found at the end, stating that they are detectors, so "SE" signals would be detected by a "SED" Secondary electron detector. Some Acronyms contian a "D" as their final letter, such as "BSED" which dose not mean "Back scatter Electron detector", but instead "Back scatter Electron Diffraction".
| Acronym | Full Text | Language | Explanation |
|---|---|---|---|
| SE | Secondary Electron | English | Low energy electrons emitted from the surface (interaction volume) by impact of the primary beam. |
| BSE | Back scatter Electron | English | Reflected electrons of about the energy of the primary beam. |
| RE | Reflected Electron | English / Germany | Older term for BSE, often used in the German language. |
| BSED | Backscattered electron Diffraction | English | The Angle and crystal structure dependent reflected electrons, forming Kikuchi lines. |
| SAD | Selected Area Diffraction | English | Alternative methode of drawing Kichuchi lines by changing the entry angle of the electron beam into a fixed spot of the specimen. |
| EBIC | Electron Beam Induced Current | English | The electric current produced by the Primary beam. |
| SC | [[ Specimen Current | English | Alternative term for EBIC |