Difference between revisions of "Tesla"
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(Created page with "Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is l...") |
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Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is located in Brno (Czech Republic), which is considered to be the cradle of electron microscopy in Europe. | Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is located in Brno (Czech Republic), which is considered to be the cradle of electron microscopy in Europe. | ||
+ | |||
+ | = Transmission Electron Microsocpes = | ||
+ | {{Tem list entry|Microscope Name=BS 242E|Microscope Picture File=Tesla - BS 242E - Meek.png|Year=|Successor=Unkown|Magnification Range=1000x - 30Kx, 10 steps|Magnification Gauge Type=|Specemin Chamber Pressure=|Power Consumption=850VA|System Weught=130 lbs (column)+ 180lbs (psu)|Accelerator Type=|Cathode Type=|Acceleration Voltage=40 KV, (60 KV Optional)|Stability=|Cathode Heating Methode=HF|Alignment Methode=Mechanical|No. of Condensor Lenses=0|Condensor Stability=N/A|Condensor Stigmator=N/A|Minimum Spot Size=N/A|Condensor Alignment=N/A|Condensor Lens Type=N/A|Holder Type=Top Entery Cartridge|Travel Range=|Obj. Focal Length=3 mm|Obj. Adjustment Range=|Obj. Spherical Error=|Obj. Stability=|Obj. Stigmator=|Obj. Alignment Aid=|Point Resolution=25|Obj. Lens Type=Electromagnetic|No. of Proj. Lenses=3|Proj. Stability=|Proj. Polpiece Config=Single Polpiece|Proj. Mag=|Proj. Alignment=|Proj. Lens Type=}} | ||
+ | |||
+ | {{Tem list entry|Microscope Name=BS 513A|Microscope Picture File=Tesla - BS 513A.png|Year=|Successor=Unkown|Magnification Range=300x, 2500x - 250Kx in 12 steps|Magnification Gauge Type=|Specemin Chamber Pressure=|Power Consumption=4 KVA|System Weught=730 lbs (column), 250lbs (Powersupply)|Accelerator Type=|Cathode Type=|Acceleration Voltage=50, 80, 100 KV|Stability=|Cathode Heating Methode=|Alignment Methode=|No. of Condensor Lenses=2|Condensor Stability=|Condensor Stigmator=quadropol|Minimum Spot Size=|Condensor Alignment=Mechanical|Condensor Lens Type=|Holder Type=Top Entery Cartridge|Travel Range=|Obj. Focal Length=|Obj. Adjustment Range=|Obj. Spherical Error=|Obj. Stability=|Obj. Stigmator=|Obj. Alignment Aid=|Point Resolution=4.5|Obj. Lens Type=Electromagnetic|No. of Proj. Lenses=2|Proj. Stability=|Proj. Polpiece Config=Single Polpiece|Proj. Mag=|Proj. Alignment=|Proj. Lens Type=}} | ||
+ | |||
+ | = Scanning Electron Microscopes = | ||
+ | {{SEM List Entry | ||
+ | |Microscope Name=BS 343 | ||
+ | |Microscope Picture File=Tesla - BS 343 - brochure image.jpg | ||
+ | |Year= | ||
+ | |Successor= | ||
+ | |Magnification Range=10x - 50Kx | ||
+ | |Magnification Gauge Type= | ||
+ | |Specemin Chamber Pressure=< 6e-4 mBar | ||
+ | |Power Consumption=1.5 KVA | ||
+ | |System Weight= | ||
+ | |Accelerator Type=Self Biased Triode Gun | ||
+ | |Cathode Type=Tungsten Hairpin | ||
+ | |Accelerating Voltage=15 KV | ||
+ | |Stability= | ||
+ | |Cathode Heating Methode= | ||
+ | |Alignment Methode=Electromagnetic | ||
+ | |Number of Condensor Lenses=2 | ||
+ | |Condensor Current Stability= | ||
+ | |Condensor Stigmator= | ||
+ | |Condensor Aperture= | ||
+ | |Condensor Alignment= | ||
+ | |Condensor Lens Type=Electromagnetic | ||
+ | |Stage Type=Suction Cup | ||
+ | |Sample Holder Type=3.2 mm Stub / Suction Cup | ||
+ | |X, Y Travel Range= | ||
+ | |Z Travel Range= | ||
+ | |Tilt Range= | ||
+ | |Rotation Range= | ||
+ | |Working Distance= | ||
+ | |Objective Spherical Error= | ||
+ | |Objective Current Stability= | ||
+ | |Objective Stigmator=Octopol | ||
+ | |Deflection Type=Double Deflection Electromagnetic | ||
+ | |Point Resolution=16 nm | ||
+ | |Lens Type=Electromagnetic | ||
+ | |Specimen Loading= | ||
+ | |Drive Mechanism=Micrometer Screw (Hand Operated) | ||
+ | }} | ||
[[Category:Electron Microscope]] | [[Category:Electron Microscope]] |
Latest revision as of 15:13, 27 January 2022
Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is located in Brno (Czech Republic), which is considered to be the cradle of electron microscopy in Europe.
Transmission Electron Microsocpes
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BS 513A | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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Scanning Electron Microscopes
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