Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is located in Brno (Czech Republic), which is considered to be the cradle of electron microscopy in Europe.
Transmission Electron Microsocpes
| BS 242E
|
|
| General
|
| Year
|
|
| Successor
|
Unkown
|
| Magnification Range
|
1000x - 30Kx, 10 steps
|
| Magnification Gauge Type
|
|
| Specemin Chamber Pressure
|
|
| Power Consumption
|
850VA
|
| System Weight
|
130 lbs (column)+ 180lbs (psu)
|
|
| Electrion Source
|
| Accelerator Type
|
|
| Cathode Type
|
|
| Accelerating Voltage
|
40 KV, (60 KV Optional)
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| Stability
|
|
| Cathode Heating Methode
|
HF
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| Alignment Methode
|
Mechanical
|
|
| Condensor
|
| Number of Condensor Lenses
|
0
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| Stability
|
N/A
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| Stigmator
|
N/A
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| Minimum Spot Size Diameter
|
N/A
|
| Condensor Alignment
|
N/A
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| Lens Type
|
N/A
|
|
| Stage
|
| Holder Type
|
Top Entery Cartridge
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| X, Y Travel Range
|
|
|
| Objective Lens
|
| Focal Length
|
3 mm
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| Adjustment Range
|
|
| Spherical Error
|
|
| Stability
|
|
| Stigmator
|
|
| Alignment Aids
|
|
| Point Resolution
|
25 Å
|
| Lens Type
|
Electromagnetic
|
|
| Projective Lens
|
| Number of Projective Lens
|
3
|
| Stability
|
|
| Polpeace Configuration
|
Single Polpiece
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| Avalible Polpeace Magnification(s)
|
|
| Alignment
|
|
| Lens Type
|
|
|
| BS 513A
|
|
| General
|
| Year
|
|
| Successor
|
Unkown
|
| Magnification Range
|
300x, 2500x - 250Kx in 12 steps
|
| Magnification Gauge Type
|
|
| Specemin Chamber Pressure
|
|
| Power Consumption
|
4 KVA
|
| System Weight
|
730 lbs (column), 250lbs (Powersupply)
|
|
| Electrion Source
|
| Accelerator Type
|
|
| Cathode Type
|
|
| Accelerating Voltage
|
50, 80, 100 KV
|
| Stability
|
|
| Cathode Heating Methode
|
|
| Alignment Methode
|
|
|
| Condensor
|
| Number of Condensor Lenses
|
2
|
| Stability
|
|
| Stigmator
|
quadropol
|
| Minimum Spot Size Diameter
|
|
| Condensor Alignment
|
Mechanical
|
| Lens Type
|
|
|
| Stage
|
| Holder Type
|
Top Entery Cartridge
|
| X, Y Travel Range
|
|
|
| Objective Lens
|
| Focal Length
|
|
| Adjustment Range
|
|
| Spherical Error
|
|
| Stability
|
|
| Stigmator
|
|
| Alignment Aids
|
|
| Point Resolution
|
4.5 Å
|
| Lens Type
|
Electromagnetic
|
|
| Projective Lens
|
| Number of Projective Lens
|
2
|
| Stability
|
|
| Polpeace Configuration
|
Single Polpiece
|
| Avalible Polpeace Magnification(s)
|
|
| Alignment
|
|
| Lens Type
|
|
|
Scanning Electron Microscopes
| BS 343
|
|
| General
|
| Year
|
|
| Successor
|
[[]]
|
| Magnification Range
|
10x - 50Kx
|
| Magnification Gauge Type
|
|
| Specemin Chamber Pressure
|
< 6e-4 mBar
|
| Power Consumption
|
1.5 KVA
|
| System Weight
|
|
|
| Electrion Source
|
| Accelerator Type
|
Self Biased Triode Gun
|
| Cathode Type
|
Tungsten Hairpin
|
| Accelerating Voltage
|
15 KV
|
| Stability
|
|
| Cathode Heating Methode
|
|
| Alignment Methode
|
Electromagnetic
|
|
| Condensor
|
| Number of Condensor Lenses
|
2
|
| Current Stability
|
|
| Stigmator
|
|
| Aperture
|
|
| Condensor Alignment
|
|
| Lens Type
|
Electromagnetic
|
|
| Stage
|
| Stage Type
|
Suction Cup
|
| Specimen Loading
|
|
| Sample Holder Type
|
3.2 mm Stub / Suction Cup
|
| X, Y Travel Range
|
|
| Z Travel Range
|
|
| Tilt Range
|
|
| Rotation Range
|
|
| Drive Mechanism
|
Micrometer Screw (Hand Operated)
|
|
| Objective Lens
|
| Working Distance
|
|
| Spherical Error
|
|
| Current Stability
|
|
| Stigmator
|
Octopol
|
| Deflection Type
|
Double Deflection Electromagnetic
|
| Point Resolution
|
16 nm
|
| Lens Type
|
Electromagnetic
|
|