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Materials Analysis Company was a USA based maker of Scanning Electron Microscopes
Models
| 700
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| [[File:|200px|link=700]]
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| General
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| Year
|
|
| Successor
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[[]]
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| Magnification Range
|
10 - 100kx[1]
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| Magnification Gauge Type
|
|
| Specemin Chamber Pressure
|
|
| Power Consumption
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|
| System Weight
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|
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| Electrion Source
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| Accelerator Type
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|
| Cathode Type
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Tungsten Hairpin
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| Accelerating Voltage
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1.5 kV - 30 kV[1]
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| Stability
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|
| Cathode Heating Methode
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| Alignment Methode
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|
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| Condensor
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| Number of Condensor Lenses
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2
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| Current Stability
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|
| Stigmator
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None
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| Aperture
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|
| Condensor Alignment
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| Lens Type
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Electromagnetic, Polepiece & Capsule
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| Stage
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| Stage Type
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| Specimen Loading
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| Sample Holder Type
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| X, Y Travel Range
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| Z Travel Range
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| Tilt Range
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| Rotation Range
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| Drive Mechanism
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|
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| Objective Lens
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| Working Distance
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0 - 50mm[1]
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| Spherical Error
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| Current Stability
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|
| Stigmator
|
|
| Deflection Type
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|
| Point Resolution
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<20 nm [1]
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| Lens Type
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Electromagnetic
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|
- ↑ 1.0 1.1 1.2 1.3 J. A. Swift, "Electron Microscopes", Laboratory Instruments and Techniques Series (Kogan ae London, Barnes and Nobel New York 1970), Tabel 1