Difference between revisions of "JEOL"

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= short list =
 
= short list =
== SEM ==
+
The lists below include most but not all microscopes and analytical machines created by JEOL since its founding up until 1999, based on a graphic from that time. More models will be added as new information is made available to the Museum.
JSM-1: 1966
+
== Transmission Electron Microscope (TEM) ==
JSM-2: 1967
+
* JEM-1: 1950
JSM-U3: 1969
+
* JEM-4A: 1952
JSM-50A: 1970
+
* JEM-4B: 1953
JSM-35: 1973
+
* JEM-5G: 1955
JSFM-30: 1974
+
* JEM-T4: 1955
JSM-T20: 1976
+
* JEM-5Y: 1959
JSM-25: 1977
+
* JEM-6A: 1961
JSM-F7: 1977
+
* JEM-6C: 1961
JSM-1200: 1978
+
* JEM-T6: 1961
JSM-840: 1982
+
* JEM-30: 1963
JSM-T300: 1982
+
* JEM-7: 1964
JSM-8?0: 1984
+
* JEM-T7: 1965
JSM-820: 1986
+
* JEM-1000: 1966
JSM-890: 1987
+
* JEM-200: 1967
JSM-840F: 1988
+
* JEM-T80B: 1969
JSM-5200: 1988
+
* JEM-T8: 1971
JSM-6100: 1989
+
* JEM-100B: 1972
JSM-6400F: 1989
+
* JEM-100C: 1973
JSM-5300: 1989
+
* JEM-500D: 1973
JSM-5400: 1989
+
* JEM-100S: 1974
JSM-6300F: 1990
+
* JEM-100CX: 1976
JSM-6600F: 1990
+
* JEM-200CX: 1978
JSM-5800: 1993
+
* JEM-1200EX: 1981
JSM-6320F: 1994
+
* JEM-ARM1000: 1982
JSM-6340F: 1996
+
* JEM-2000EX: 1984
JSM-5600: 1997
+
* JEM-2000FX: 1984
 +
* JEM-4000EX: 1984
 +
* JEM-4000FX: 1985
 +
* JEM-200FXV: 1986
 +
* JEM-2000SCM: 1986
 +
* JEM-2010: 1989
 +
* JEM-3010: 1990
 +
* JEM-1210: 1990
 +
* JEM-1010: 1991
 +
* JEM-2010F: 1993
 +
* JEM-1220: 1995
 +
* JEM-4010: 1996
 +
* JEM-ARM1250: 1997
 +
* JEM-2010FEF: 1998
 +
* JEM-1230: 1998
 +
 
 +
== Scanning Electron Microscope (SEM) ==
 +
*JSM-1: 1966
 +
*JSM-2: 1967
 +
*JSM-U3: 1969
 +
*JSM-50A: 1970
 +
*JSM-35: 1973
 +
*JSFM-30: 1974
 +
*JSM-T20: 1976
 +
*JSM-25: 1977
 +
*JSM-F7: 1977
 +
*JSM-1200: 1978
 +
*JSM-840: 1982
 +
*JSM-T300: 1982
 +
*JSM-8?0: 1984
 +
*JSM-820: 1986
 +
*JSM-890: 1987
 +
*JSM-840F: 1988
 +
*JSM-5200: 1988
 +
*JSM-6100: 1989
 +
*JSM-6400F: 1989
 +
*JSM-5300: 1989
 +
*JSM-5400: 1989
 +
*JSM-6300F: 1990
 +
*JSM-6600F: 1990
 +
*JSM-5800: 1993
 +
*JSM-6320F: 1994
 +
*JSM-6340F: 1996
 +
*JSM-5600: 1997
 +
 
 +
== Electron Probe Microanalyzer (EPMA) ==
 +
* JXA-1: 1961
 +
* JXA-5: 1969
 +
* JXA-733: 1978
 +
* JXA-8600: 1986
 +
* JXA-8800: 1991
 +
* JXA-8900: 1992
  
 
[[Category:Electron Microscope]]
 
[[Category:Electron Microscope]]

Latest revision as of 01:32, 26 November 2024

JEOL is an abreviation for "Japanese Electron Optical Laboretory" which was one of Japans first Electron Microscope makers. They are famous for many inovations and machines, including commercialization of the Spherical Abberation Corrector based on the principles of Scherzers Darmstadt Korrektor, as well as building the largest commercial Electron Microscopes ever made.

Transmission Electron Microscopes

JEM-30
JEOL - JEM 50B - Meek.png
General
Year
Successor Unkown
Magnification Range 2000x, 3000x, 4000x
Magnification Gauge Type
Specemin Chamber Pressure
Power Consumption 1 KVA
System Weight 400 lbs
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage 30 KV
Stability
Cathode Heating Methode
Alignment Methode Mechanical
Condensor
Number of Condensor Lenses 0
Stability N/A
Stigmator N/A
Minimum Spot Size Diameter
Condensor Alignment N/A
Lens Type N/A
Stage
Holder Type Side Entery rod
X, Y Travel Range
Objective Lens
Focal Length
Adjustment Range
Spherical Error
Stability
Stigmator
Alignment Aids
Point Resolution 100 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 1
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type


JEM-30B
JEOL - JEM 50B - Meek.png
General
Year
Successor Unkown
Magnification Range 2000x, 3000x, 4000x
Magnification Gauge Type
Specemin Chamber Pressure
Power Consumption 1 KVA
System Weight 400 lbs
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage 30 KV
Stability
Cathode Heating Methode
Alignment Methode Mechanical
Condensor
Number of Condensor Lenses 0
Stability N/A
Stigmator N/A
Minimum Spot Size Diameter
Condensor Alignment N/A
Lens Type N/A
Stage
Holder Type Side Entery rod
X, Y Travel Range
Objective Lens
Focal Length
Adjustment Range
Spherical Error
Stability
Stigmator
Alignment Aids
Point Resolution 100 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 1
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type


JEM-50B
JEOL - JEM 50B - Meek.png
General
Year
Successor Unkown
Magnification Range 2000x, 3000x, 4000x
Magnification Gauge Type
Specemin Chamber Pressure
Power Consumption 1 KVA
System Weight 500 lbs
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage 50 KV
Stability
Cathode Heating Methode
Alignment Methode Mechanical
Condensor
Number of Condensor Lenses 0
Stability N/A
Stigmator N/A
Minimum Spot Size Diameter
Condensor Alignment N/A
Lens Type N/A
Stage
Holder Type Side Entery rod
X, Y Travel Range
Objective Lens
Focal Length
Adjustment Range
Spherical Error
Stability
Stigmator
Alignment Aids
Point Resolution 100 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 1
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type


JEM T-7
JEOL - JEM T7 - MEEK.png
General
Year
Successor [[]]
Magnification Range 120x, 600x - 80Kx
Magnification Gauge Type Mechanical
Specemin Chamber Pressure
Power Consumption 2 KVA
System Weight
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage 60 KV
Stability
Cathode Heating Methode
Alignment Methode
Condensor
Number of Condensor Lenses 1
Stability
Stigmator N/A
Minimum Spot Size Diameter
Condensor Alignment Mechanical
Lens Type
Stage
Holder Type Top Entery Cartridge
X, Y Travel Range
Objective Lens
Focal Length
Adjustment Range
Spherical Error
Stability
Stigmator Quadropol
Alignment Aids
Point Resolution 10 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 2
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type


JEM-7A
JEOL - JEM 7A - Meek.png
General
Year
Successor [[]]
Magnification Range 120x, 600x - 250Kx
Magnification Gauge Type
Specemin Chamber Pressure
Power Consumption 4.5 KVA
System Weight 3260lbs (column), 770 lbs (Powersupply), 143 lbs (pumps)
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage 50, 80, 100 KV
Stability
Cathode Heating Methode HF
Alignment Methode Mechanical
Condensor
Number of Condensor Lenses 2
Stability
Stigmator Mechanical
Minimum Spot Size Diameter
Condensor Alignment
Lens Type
Stage
Holder Type Top Entery Cartridge
X, Y Travel Range
Objective Lens
Focal Length 3 mm
Adjustment Range
Spherical Error
Stability
Stigmator Octopol, Centerable
Alignment Aids
Point Resolution 4.5 - 6 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 2
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type


JEM-100B
JEOL - JEM 100B - Meek.png
General
Year
Successor [[]]
Magnification Range 190x, 5Kx, 500x - 500Kx
Magnification Gauge Type Digital
Specemin Chamber Pressure
Power Consumption 4.5 KVA
System Weight 1000 lbs (console), 800 lbs (powersupply), 100 lbs (pumpbox)
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage 20, 40, 60, 80, 100 KV
Stability
Cathode Heating Methode DC
Alignment Methode Mechanical
Condensor
Number of Condensor Lenses 2
Stability
Stigmator Octopol
Minimum Spot Size Diameter
Condensor Alignment Electromagnetic
Lens Type
Stage
Holder Type Top Entery Cartridge
X, Y Travel Range
Objective Lens
Focal Length 1.6 mm
Adjustment Range
Spherical Error
Stability
Stigmator Quadropol
Alignment Aids
Point Resolution 3 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 3
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type


JEM-100C
[[File:|200px|link=JEM-100C]]
General
Year
Successor [[]]
Magnification Range 90, 250, 500, 750x, 1050x - 800Kx (HR Stage), 660-500Kx (TEG), 330-250Kx (SEG)
Magnification Gauge Type Digital
Specemin Chamber Pressure
Power Consumption 4.5 KVA
System Weight 1655Kg
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage 20, 40, 60, 80, 100, 120 KV
Stability
Cathode Heating Methode DC
Alignment Methode Electromechanical
Condensor
Number of Condensor Lenses 2
Stability
Stigmator quadropol
Minimum Spot Size Diameter
Condensor Alignment
Lens Type
Stage
Holder Type Top Entery Cartridge
X, Y Travel Range
Objective Lens
Focal Length 1.6mm (HR), 3.1 mm (TEG), 5 mm (SEG)
Adjustment Range
Spherical Error
Stability
Stigmator
Alignment Aids Wobbler
Point Resolution 1.4 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 3
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type

JEM-7 : 1968 JEM-1000 D/S 1966



short list

The lists below include most but not all microscopes and analytical machines created by JEOL since its founding up until 1999, based on a graphic from that time. More models will be added as new information is made available to the Museum.

Transmission Electron Microscope (TEM)

  • JEM-1: 1950
  • JEM-4A: 1952
  • JEM-4B: 1953
  • JEM-5G: 1955
  • JEM-T4: 1955
  • JEM-5Y: 1959
  • JEM-6A: 1961
  • JEM-6C: 1961
  • JEM-T6: 1961
  • JEM-30: 1963
  • JEM-7: 1964
  • JEM-T7: 1965
  • JEM-1000: 1966
  • JEM-200: 1967
  • JEM-T80B: 1969
  • JEM-T8: 1971
  • JEM-100B: 1972
  • JEM-100C: 1973
  • JEM-500D: 1973
  • JEM-100S: 1974
  • JEM-100CX: 1976
  • JEM-200CX: 1978
  • JEM-1200EX: 1981
  • JEM-ARM1000: 1982
  • JEM-2000EX: 1984
  • JEM-2000FX: 1984
  • JEM-4000EX: 1984
  • JEM-4000FX: 1985
  • JEM-200FXV: 1986
  • JEM-2000SCM: 1986
  • JEM-2010: 1989
  • JEM-3010: 1990
  • JEM-1210: 1990
  • JEM-1010: 1991
  • JEM-2010F: 1993
  • JEM-1220: 1995
  • JEM-4010: 1996
  • JEM-ARM1250: 1997
  • JEM-2010FEF: 1998
  • JEM-1230: 1998

Scanning Electron Microscope (SEM)

  • JSM-1: 1966
  • JSM-2: 1967
  • JSM-U3: 1969
  • JSM-50A: 1970
  • JSM-35: 1973
  • JSFM-30: 1974
  • JSM-T20: 1976
  • JSM-25: 1977
  • JSM-F7: 1977
  • JSM-1200: 1978
  • JSM-840: 1982
  • JSM-T300: 1982
  • JSM-8?0: 1984
  • JSM-820: 1986
  • JSM-890: 1987
  • JSM-840F: 1988
  • JSM-5200: 1988
  • JSM-6100: 1989
  • JSM-6400F: 1989
  • JSM-5300: 1989
  • JSM-5400: 1989
  • JSM-6300F: 1990
  • JSM-6600F: 1990
  • JSM-5800: 1993
  • JSM-6320F: 1994
  • JSM-6340F: 1996
  • JSM-5600: 1997

Electron Probe Microanalyzer (EPMA)

  • JXA-1: 1961
  • JXA-5: 1969
  • JXA-733: 1978
  • JXA-8600: 1986
  • JXA-8800: 1991
  • JXA-8900: 1992

High Voltage Electron Microsocpes

JEM-4000FX (AHP40S)
JEOL-JEM4000FX-system.jpg
General
Year 1986
Successor JEM-4100
Magnification Range 60x-3Kx, 5Kx - 1.2Mx
Magnification Gauge Type Digital
Specemin Chamber Pressure
Power Consumption 20 KVA
System Weight 4300 Kg (Console), 500 Kg (Powersupply)
Electrion Source
Accelerator Type 14 stage Electrostatic LINAC
Cathode Type LaB6
Accelerating Voltage 200 KV, 250 KV 300 KV, 350 KV, 400 KV, 100V Steps
Stability 2e-6/min
Cathode Heating Methode DC
Alignment Methode Electromagnetic
Condensor
Number of Condensor Lenses 3 (5)
Stability
Stigmator Octopol
Minimum Spot Size Diameter 2µm - 2nm
Condensor Alignment Electromagnetic
Lens Type Electromagnetic
Stage
Holder Type Side Entery rod
X, Y Travel Range 8 mm (x), 2 mm (y), 0.5 mm (z)
Objective Lens
Focal Length 3.1 mm
Adjustment Range
Spherical Error 1.8 mm
Stability 1e-6/min
Stigmator Quadropol
Alignment Aids
Point Resolution 1.4 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 5
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment Mechanical, Electromagnetic
Lens Type Electromagnetic


JEM-4000FX (AHP40L)
JEOL-JEM4000FX-system.jpg
General
Year 1986
Successor JEM-4100
Magnification Range 60x-3Kx, 5Kx - 800Kx
Magnification Gauge Type Digital
Specemin Chamber Pressure
Power Consumption 20 KVA
System Weight 4300 Kg (Console), 500 Kg (Powersupply)
Electrion Source
Accelerator Type 14 stage Electrostatic LINAC
Cathode Type LaB6
Accelerating Voltage 100 Kv, 150 KV,200 KV, 250 KV 300 KV, 350 KV, 400 KV, 100V Steps
Stability 2e-6/min
Cathode Heating Methode DC
Alignment Methode Electromagnetic
Condensor
Number of Condensor Lenses 3 (5)
Stability
Stigmator Octopol
Minimum Spot Size Diameter 2µm - 2nm
Condensor Alignment Electromagnetic
Lens Type Electromagnetic
Stage
Holder Type Side Entery rod
X, Y Travel Range 8 mm (x), 2 mm (y), 0.5 mm (z)
Objective Lens
Focal Length 4.4 mm
Adjustment Range
Spherical Error 3.4 mm
Stability 1e-6/min
Stigmator Quadropol
Alignment Aids
Point Resolution 1.4 Å
Lens Type Electromagnetic
Projective Lens
Number of Projective Lens 5
Stability
Polpeace Configuration Single Polpiece
Avalible Polpeace Magnification(s)
Alignment Mechanical, Electromagnetic
Lens Type Electromagnetic