Difference between revisions of "JEOL"
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JEM-7 : 1968 | JEM-7 : 1968 | ||
JEM-1000 D/S 1966 | JEM-1000 D/S 1966 | ||
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| + | = short list = | ||
| + | The lists below include most but not all microscopes and analytical machines created by JEOL since its founding up until 1999, based on a graphic from that time. More models will be added as new information is made available to the Museum. | ||
| + | == Transmission Electron Microscope (TEM) == | ||
| + | * JEM-1: 1950 | ||
| + | * JEM-4A: 1952 | ||
| + | * JEM-4B: 1953 | ||
| + | * JEM-5G: 1955 | ||
| + | * JEM-T4: 1955 | ||
| + | * JEM-5Y: 1959 | ||
| + | * JEM-6A: 1961 | ||
| + | * JEM-6C: 1961 | ||
| + | * JEM-T6: 1961 | ||
| + | * JEM-30: 1963 | ||
| + | * JEM-7: 1964 | ||
| + | * JEM-T7: 1965 | ||
| + | * JEM-1000: 1966 | ||
| + | * JEM-200: 1967 | ||
| + | * JEM-T80B: 1969 | ||
| + | * JEM-T8: 1971 | ||
| + | * JEM-100B: 1972 | ||
| + | * JEM-100C: 1973 | ||
| + | * JEM-500D: 1973 | ||
| + | * JEM-100S: 1974 | ||
| + | * JEM-100CX: 1976 | ||
| + | * JEM-200CX: 1978 | ||
| + | * JEM-1200EX: 1981 | ||
| + | * JEM-ARM1000: 1982 | ||
| + | * JEM-2000EX: 1984 | ||
| + | * JEM-2000FX: 1984 | ||
| + | * JEM-4000EX: 1984 | ||
| + | * JEM-4000FX: 1985 | ||
| + | * JEM-200FXV: 1986 | ||
| + | * JEM-2000SCM: 1986 | ||
| + | * JEM-2010: 1989 | ||
| + | * JEM-3010: 1990 | ||
| + | * JEM-1210: 1990 | ||
| + | * JEM-1010: 1991 | ||
| + | * JEM-2010F: 1993 | ||
| + | * JEM-1220: 1995 | ||
| + | * JEM-4010: 1996 | ||
| + | * JEM-ARM1250: 1997 | ||
| + | * JEM-2010FEF: 1998 | ||
| + | * JEM-1230: 1998 | ||
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| + | == Scanning Electron Microscope (SEM) == | ||
| + | *JSM-1: 1966 | ||
| + | *JSM-2: 1967 | ||
| + | *JSM-U3: 1969 | ||
| + | *JSM-50A: 1970 | ||
| + | *JSM-35: 1973 | ||
| + | *JSFM-30: 1974 | ||
| + | *JSM-T20: 1976 | ||
| + | *JSM-25: 1977 | ||
| + | *JSM-F7: 1977 | ||
| + | *JSM-1200: 1978 | ||
| + | *JSM-840: 1982 | ||
| + | *JSM-T300: 1982 | ||
| + | *JSM-8?0: 1984 | ||
| + | *JSM-820: 1986 | ||
| + | *JSM-890: 1987 | ||
| + | *JSM-840F: 1988 | ||
| + | *JSM-5200: 1988 | ||
| + | *JSM-6100: 1989 | ||
| + | *JSM-6400F: 1989 | ||
| + | *JSM-5300: 1989 | ||
| + | *JSM-5400: 1989 | ||
| + | *JSM-6300F: 1990 | ||
| + | *JSM-6600F: 1990 | ||
| + | *JSM-5800: 1993 | ||
| + | *JSM-6320F: 1994 | ||
| + | *JSM-6340F: 1996 | ||
| + | *JSM-5600: 1997 | ||
| + | |||
| + | == Electron Probe Microanalyzer (EPMA) == | ||
| + | * JXA-1: 1961 | ||
| + | * JXA-5: 1969 | ||
| + | * JXA-733: 1978 | ||
| + | * JXA-8600: 1986 | ||
| + | * JXA-8800: 1991 | ||
| + | * JXA-8900: 1992 | ||
[[Category:Electron Microscope]] | [[Category:Electron Microscope]] | ||
= High Voltage Electron Microsocpes = | = High Voltage Electron Microsocpes = | ||
| − | {{Tem list entry|Microscope Name=JEM-4000FX (AHP40S)|Microscope Picture File=JEOL-JEM4000FX-system.jpg|Year=|Successor=JEM-4100|Magnification Range=60x-3Kx, 5Kx - 1.2Mx|Magnification Gauge Type=Digital|Specemin Chamber Pressure=|Power Consumption=20 KVA|System Weught=4300 Kg (Console), 500 Kg (Powersupply)|Accelerator Type= 14 stage Electrostatic LINAC|Cathode Type=LaB6|Acceleration Voltage=200 KV, 250 KV 300 KV, 350 KV, 400 KV, 100V Steps|Stability=2e-6/min|Cathode Heating Methode=DC|Alignment Methode=Electromagnetic|No. of Condensor Lenses=3 (5)|Condensor Stability=|Condensor Stigmator=Octopol|Minimum Spot Size=2µm - 2nm|Condensor Alignment=Electromagnetic|Condensor Lens Type=Electromagnetic|Holder Type=Side Entery rod|Travel Range=8 mm (x), 2 mm (y), 0.5 mm (z)|Obj. Focal Length=3.1 mm|Obj. Adjustment Range=|Obj. Spherical Error=1.8 mm|Obj. Stability=1e-6/min|Obj. Stigmator=Quadropol|Obj. Alignment Aid=|Point Resolution=1.4|Obj. Lens Type=Electromagnetic|No. of Proj. Lenses=5|Proj. Stability=|Proj. Polpiece Config=Single Polpiece|Proj. Mag=|Proj. Alignment=Mechanical, Electromagnetic|Proj. Lens Type=Electromagnetic}} | + | {{Tem list entry|Microscope Name=JEM-4000FX (AHP40S)|Microscope Picture File=JEOL-JEM4000FX-system.jpg|Year=1986|Successor=JEM-4100|Magnification Range=60x-3Kx, 5Kx - 1.2Mx|Magnification Gauge Type=Digital|Specemin Chamber Pressure=|Power Consumption=20 KVA|System Weught=4300 Kg (Console), 500 Kg (Powersupply)|Accelerator Type= 14 stage Electrostatic LINAC|Cathode Type=LaB6|Acceleration Voltage=200 KV, 250 KV 300 KV, 350 KV, 400 KV, 100V Steps|Stability=2e-6/min|Cathode Heating Methode=DC|Alignment Methode=Electromagnetic|No. of Condensor Lenses=3 (5)|Condensor Stability=|Condensor Stigmator=Octopol|Minimum Spot Size=2µm - 2nm|Condensor Alignment=Electromagnetic|Condensor Lens Type=Electromagnetic|Holder Type=Side Entery rod|Travel Range=8 mm (x), 2 mm (y), 0.5 mm (z)|Obj. Focal Length=3.1 mm|Obj. Adjustment Range=|Obj. Spherical Error=1.8 mm|Obj. Stability=1e-6/min|Obj. Stigmator=Quadropol|Obj. Alignment Aid=|Point Resolution=1.4|Obj. Lens Type=Electromagnetic|No. of Proj. Lenses=5|Proj. Stability=|Proj. Polpiece Config=Single Polpiece|Proj. Mag=|Proj. Alignment=Mechanical, Electromagnetic|Proj. Lens Type=Electromagnetic}} |
| − | {{Tem list entry|Microscope Name=JEM-4000FX (AHP40L)|Microscope Picture File=JEOL-JEM4000FX-system.jpg|Year=|Successor=JEM-4100|Magnification Range=60x-3Kx, 5Kx - 800Kx|Magnification Gauge Type=Digital|Specemin Chamber Pressure=|Power Consumption=20 KVA|System Weught=4300 Kg (Console), 500 Kg (Powersupply)|Accelerator Type= 14 stage Electrostatic LINAC|Cathode Type=LaB6|Acceleration Voltage=100 Kv, 150 KV,200 KV, 250 KV 300 KV, 350 KV, 400 KV, 100V Steps|Stability=2e-6/min|Cathode Heating Methode=DC|Alignment Methode=Electromagnetic|No. of Condensor Lenses=3 (5)|Condensor Stability=|Condensor Stigmator=Octopol|Minimum Spot Size=2µm - 2nm|Condensor Alignment=Electromagnetic|Condensor Lens Type=Electromagnetic|Holder Type=Side Entery rod|Travel Range=8 mm (x), 2 mm (y), 0.5 mm (z)|Obj. Focal Length=4.4 mm|Obj. Adjustment Range=|Obj. Spherical Error=3.4 mm|Obj. Stability=1e-6/min|Obj. Stigmator=Quadropol|Obj. Alignment Aid=|Point Resolution=1.4|Obj. Lens Type=Electromagnetic|No. of Proj. Lenses=5|Proj. Stability=|Proj. Polpiece Config=Single Polpiece|Proj. Mag=|Proj. Alignment=Mechanical, Electromagnetic|Proj. Lens Type=Electromagnetic}} | + | {{Tem list entry|Microscope Name=JEM-4000FX (AHP40L)|Microscope Picture File=JEOL-JEM4000FX-system.jpg|Year=1986|Successor=JEM-4100|Magnification Range=60x-3Kx, 5Kx - 800Kx|Magnification Gauge Type=Digital|Specemin Chamber Pressure=|Power Consumption=20 KVA|System Weught=4300 Kg (Console), 500 Kg (Powersupply)|Accelerator Type= 14 stage Electrostatic LINAC|Cathode Type=LaB6|Acceleration Voltage=100 Kv, 150 KV,200 KV, 250 KV 300 KV, 350 KV, 400 KV, 100V Steps|Stability=2e-6/min|Cathode Heating Methode=DC|Alignment Methode=Electromagnetic|No. of Condensor Lenses=3 (5)|Condensor Stability=|Condensor Stigmator=Octopol|Minimum Spot Size=2µm - 2nm|Condensor Alignment=Electromagnetic|Condensor Lens Type=Electromagnetic|Holder Type=Side Entery rod|Travel Range=8 mm (x), 2 mm (y), 0.5 mm (z)|Obj. Focal Length=4.4 mm|Obj. Adjustment Range=|Obj. Spherical Error=3.4 mm|Obj. Stability=1e-6/min|Obj. Stigmator=Quadropol|Obj. Alignment Aid=|Point Resolution=1.4|Obj. Lens Type=Electromagnetic|No. of Proj. Lenses=5|Proj. Stability=|Proj. Polpiece Config=Single Polpiece|Proj. Mag=|Proj. Alignment=Mechanical, Electromagnetic|Proj. Lens Type=Electromagnetic}} |
[[Category:Electron Microscope]] | [[Category:Electron Microscope]] | ||
Latest revision as of 01:32, 26 November 2024
JEOL is an abreviation for "Japanese Electron Optical Laboretory" which was one of Japans first Electron Microscope makers. They are famous for many inovations and machines, including commercialization of the Spherical Abberation Corrector based on the principles of Scherzers Darmstadt Korrektor, as well as building the largest commercial Electron Microscopes ever made.
Transmission Electron Microscopes
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| JEM-50B | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| JEM T-7 | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| JEM-7A | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| JEM-100B | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| JEM-100C | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| [[File:|200px|link=JEM-100C]] |
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JEM-7 : 1968 JEM-1000 D/S 1966
short list
The lists below include most but not all microscopes and analytical machines created by JEOL since its founding up until 1999, based on a graphic from that time. More models will be added as new information is made available to the Museum.
Transmission Electron Microscope (TEM)
- JEM-1: 1950
- JEM-4A: 1952
- JEM-4B: 1953
- JEM-5G: 1955
- JEM-T4: 1955
- JEM-5Y: 1959
- JEM-6A: 1961
- JEM-6C: 1961
- JEM-T6: 1961
- JEM-30: 1963
- JEM-7: 1964
- JEM-T7: 1965
- JEM-1000: 1966
- JEM-200: 1967
- JEM-T80B: 1969
- JEM-T8: 1971
- JEM-100B: 1972
- JEM-100C: 1973
- JEM-500D: 1973
- JEM-100S: 1974
- JEM-100CX: 1976
- JEM-200CX: 1978
- JEM-1200EX: 1981
- JEM-ARM1000: 1982
- JEM-2000EX: 1984
- JEM-2000FX: 1984
- JEM-4000EX: 1984
- JEM-4000FX: 1985
- JEM-200FXV: 1986
- JEM-2000SCM: 1986
- JEM-2010: 1989
- JEM-3010: 1990
- JEM-1210: 1990
- JEM-1010: 1991
- JEM-2010F: 1993
- JEM-1220: 1995
- JEM-4010: 1996
- JEM-ARM1250: 1997
- JEM-2010FEF: 1998
- JEM-1230: 1998
Scanning Electron Microscope (SEM)
- JSM-1: 1966
- JSM-2: 1967
- JSM-U3: 1969
- JSM-50A: 1970
- JSM-35: 1973
- JSFM-30: 1974
- JSM-T20: 1976
- JSM-25: 1977
- JSM-F7: 1977
- JSM-1200: 1978
- JSM-840: 1982
- JSM-T300: 1982
- JSM-8?0: 1984
- JSM-820: 1986
- JSM-890: 1987
- JSM-840F: 1988
- JSM-5200: 1988
- JSM-6100: 1989
- JSM-6400F: 1989
- JSM-5300: 1989
- JSM-5400: 1989
- JSM-6300F: 1990
- JSM-6600F: 1990
- JSM-5800: 1993
- JSM-6320F: 1994
- JSM-6340F: 1996
- JSM-5600: 1997
Electron Probe Microanalyzer (EPMA)
- JXA-1: 1961
- JXA-5: 1969
- JXA-733: 1978
- JXA-8600: 1986
- JXA-8800: 1991
- JXA-8900: 1992
High Voltage Electron Microsocpes
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| JEM-4000FX (AHP40L) | ||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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