Tesla - Revision history

Lbochtler at 14:13, 27 January 2022

2022-01-27T14:13:11Z

Lbochtler at 15:40, 2 January 2022

2022-01-02T15:40:59Z

Spyfoxls: Created page with "Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is l..."

2021-09-27T17:39:40Z

Created page with "Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is l..."

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Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is located in Brno (Czech Republic), which is considered to be the cradle of electron microscopy in Europe.

[[Category:Electron Microscope]]

← Older revision		Revision as of 14:13, 27 January 2022
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	{{Tem list entry\|Microscope Name=BS 513A\|Microscope Picture File=Tesla - BS 513A.png\|Year=\|Successor=Unkown\|Magnification Range=300x, 2500x - 250Kx in 12 steps\|Magnification Gauge Type=\|Specemin Chamber Pressure=\|Power Consumption=4 KVA\|System Weught=730 lbs (column), 250lbs (Powersupply)\|Accelerator Type=\|Cathode Type=\|Acceleration Voltage=50, 80, 100 KV\|Stability=\|Cathode Heating Methode=\|Alignment Methode=\|No. of Condensor Lenses=2\|Condensor Stability=\|Condensor Stigmator=quadropol\|Minimum Spot Size=\|Condensor Alignment=Mechanical\|Condensor Lens Type=\|Holder Type=Top Entery Cartridge\|Travel Range=\|Obj. Focal Length=\|Obj. Adjustment Range=\|Obj. Spherical Error=\|Obj. Stability=\|Obj. Stigmator=\|Obj. Alignment Aid=\|Point Resolution=4.5\|Obj. Lens Type=Electromagnetic\|No. of Proj. Lenses=2\|Proj. Stability=\|Proj. Polpiece Config=Single Polpiece\|Proj. Mag=\|Proj. Alignment=\|Proj. Lens Type=}}		{{Tem list entry\|Microscope Name=BS 513A\|Microscope Picture File=Tesla - BS 513A.png\|Year=\|Successor=Unkown\|Magnification Range=300x, 2500x - 250Kx in 12 steps\|Magnification Gauge Type=\|Specemin Chamber Pressure=\|Power Consumption=4 KVA\|System Weught=730 lbs (column), 250lbs (Powersupply)\|Accelerator Type=\|Cathode Type=\|Acceleration Voltage=50, 80, 100 KV\|Stability=\|Cathode Heating Methode=\|Alignment Methode=\|No. of Condensor Lenses=2\|Condensor Stability=\|Condensor Stigmator=quadropol\|Minimum Spot Size=\|Condensor Alignment=Mechanical\|Condensor Lens Type=\|Holder Type=Top Entery Cartridge\|Travel Range=\|Obj. Focal Length=\|Obj. Adjustment Range=\|Obj. Spherical Error=\|Obj. Stability=\|Obj. Stigmator=\|Obj. Alignment Aid=\|Point Resolution=4.5\|Obj. Lens Type=Electromagnetic\|No. of Proj. Lenses=2\|Proj. Stability=\|Proj. Polpiece Config=Single Polpiece\|Proj. Mag=\|Proj. Alignment=\|Proj. Lens Type=}}
		+
		+	= Scanning Electron Microscopes =
		+	{{SEM List Entry
		+	\|Microscope Name=BS 343
		+	\|Microscope Picture File=Tesla - BS 343 - brochure image.jpg
		+	\|Year=
		+	\|Successor=
		+	\|Magnification Range=10x - 50Kx
		+	\|Magnification Gauge Type=
		+	\|Specemin Chamber Pressure=< 6e-4 mBar
		+	\|Power Consumption=1.5 KVA
		+	\|System Weight=
		+	\|Accelerator Type=Self Biased Triode Gun
		+	\|Cathode Type=Tungsten Hairpin
		+	\|Accelerating Voltage=15 KV
		+	\|Stability=
		+	\|Cathode Heating Methode=
		+	\|Alignment Methode=Electromagnetic
		+	\|Number of Condensor Lenses=2
		+	\|Condensor Current Stability=
		+	\|Condensor Stigmator=
		+	\|Condensor Aperture=
		+	\|Condensor Alignment=
		+	\|Condensor Lens Type=Electromagnetic
		+	\|Stage Type=Suction Cup
		+	\|Sample Holder Type=3.2 mm Stub / Suction Cup
		+	\|X, Y Travel Range=
		+	\|Z Travel Range=
		+	\|Tilt Range=
		+	\|Rotation Range=
		+	\|Working Distance=
		+	\|Objective Spherical Error=
		+	\|Objective Current Stability=
		+	\|Objective Stigmator=Octopol
		+	\|Deflection Type=Double Deflection Electromagnetic
		+	\|Point Resolution=16 nm
		+	\|Lens Type=Electromagnetic
		+	\|Specimen Loading=
		+	\|Drive Mechanism=Micrometer Screw (Hand Operated)
		+	}}

	[[Category:Electron Microscope]]		[[Category:Electron Microscope]]

← Older revision		Revision as of 15:40, 2 January 2022
Line 1:		Line 1:
	Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is located in Brno (Czech Republic), which is considered to be the cradle of electron microscopy in Europe.		Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is located in Brno (Czech Republic), which is considered to be the cradle of electron microscopy in Europe.
		+
		+	= Transmission Electron Microsocpes =
		+	{{Tem list entry\|Microscope Name=BS 242E\|Microscope Picture File=Tesla - BS 242E - Meek.png\|Year=\|Successor=Unkown\|Magnification Range=1000x - 30Kx, 10 steps\|Magnification Gauge Type=\|Specemin Chamber Pressure=\|Power Consumption=850VA\|System Weught=130 lbs (column)+ 180lbs (psu)\|Accelerator Type=\|Cathode Type=\|Acceleration Voltage=40 KV, (60 KV Optional)\|Stability=\|Cathode Heating Methode=HF\|Alignment Methode=Mechanical\|No. of Condensor Lenses=0\|Condensor Stability=N/A\|Condensor Stigmator=N/A\|Minimum Spot Size=N/A\|Condensor Alignment=N/A\|Condensor Lens Type=N/A\|Holder Type=Top Entery Cartridge\|Travel Range=\|Obj. Focal Length=3 mm\|Obj. Adjustment Range=\|Obj. Spherical Error=\|Obj. Stability=\|Obj. Stigmator=\|Obj. Alignment Aid=\|Point Resolution=25\|Obj. Lens Type=Electromagnetic\|No. of Proj. Lenses=3\|Proj. Stability=\|Proj. Polpiece Config=Single Polpiece\|Proj. Mag=\|Proj. Alignment=\|Proj. Lens Type=}}
		+
		+	{{Tem list entry\|Microscope Name=BS 513A\|Microscope Picture File=Tesla - BS 513A.png\|Year=\|Successor=Unkown\|Magnification Range=300x, 2500x - 250Kx in 12 steps\|Magnification Gauge Type=\|Specemin Chamber Pressure=\|Power Consumption=4 KVA\|System Weught=730 lbs (column), 250lbs (Powersupply)\|Accelerator Type=\|Cathode Type=\|Acceleration Voltage=50, 80, 100 KV\|Stability=\|Cathode Heating Methode=\|Alignment Methode=\|No. of Condensor Lenses=2\|Condensor Stability=\|Condensor Stigmator=quadropol\|Minimum Spot Size=\|Condensor Alignment=Mechanical\|Condensor Lens Type=\|Holder Type=Top Entery Cartridge\|Travel Range=\|Obj. Focal Length=\|Obj. Adjustment Range=\|Obj. Spherical Error=\|Obj. Stability=\|Obj. Stigmator=\|Obj. Alignment Aid=\|Point Resolution=4.5\|Obj. Lens Type=Electromagnetic\|No. of Proj. Lenses=2\|Proj. Stability=\|Proj. Polpiece Config=Single Polpiece\|Proj. Mag=\|Proj. Alignment=\|Proj. Lens Type=}}

	[[Category:Electron Microscope]]		[[Category:Electron Microscope]]