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Materials Analysis Company - Revision history
2026-04-22T14:30:10Z
Revision history for this page on the wiki
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http://wiki.em-museum.org/index.php?title=Materials_Analysis_Company&diff=1450&oldid=prev
Lbochtler: added the model 700
2026-03-07T15:46:03Z
<p>added the model 700</p>
<p><b>New page</b></p><div>Materials Analysis Company was a USA based maker of Scanning Electron Microscopes<br />
<br />
= Models =<br />
<br />
{{SEM List Entry<br />
|Microscope Name=700<br />
|Microscope Picture File=<br />
|Year= <br />
|Successor=<br />
|Magnification Range= 10 - 100kx<ref name="J. A. Swift 1970"> J. A. Swift, "Electron Microscopes", Laboratory Instruments and Techniques Series (Kogan ae London, Barnes and Nobel New York 1970), Tabel 1 </ref><br />
|Magnification Gauge Type= <br />
|Specemin Chamber Pressure=<br />
|Power Consumption= <br />
|System Weight= <br />
|Accelerator Type=<br />
|Cathode Type=Tungsten Hairpin<br />
|Accelerating Voltage= 1.5 kV - 30 kV<ref name="J. A. Swift 1970"/><br />
|Stability= <br />
|Cathode Heating Methode= <br />
|Alignment Methode= <br />
|Number of Condensor Lenses= 2<br />
|Condensor Current Stability= <br />
|Condensor Stigmator= None<br />
|Condensor Aperture=<br />
|Condensor Alignment= <br />
|Condensor Lens Type= Electromagnetic, Polepiece & Capsule<br />
|Stage Type=<br />
|Sample Holder Type=<br />
|X, Y Travel Range= <br />
|Z Travel Range= <br />
|Tilt Range= <br />
|Rotation Range= <br />
|Working Distance= 0 - 50mm<ref name="J. A. Swift 1970"/><br />
|Objective Spherical Error=<br />
|Objective Current Stability= <br />
|Objective Stigmator=<br />
|Deflection Type=<br />
|Point Resolution= <20 nm <ref name="J. A. Swift 1970"/><br />
|Lens Type=Electromagnetic<br />
|Specimen Loading= <br />
|Drive Mechanism=<br />
}}</div>
Lbochtler