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Japan also started deveolping Electron Microscopes, two major Companies stood out, [[JEOL]] and [[Hitachi]], which still to this day, produce Electron Microscopes of the highest Quality. Hitachi Pioneered the use of the [Cold Field Emmision Cathode], first seen in their <inser name of first FESEM here>.
Japan also started deveolping Electron Microscopes, two major Companies stood out, [[JEOL]] and [[Hitachi]], which still to this day, produce Electron Microscopes of the highest Quality. Hitachi Pioneered the use of the [Cold Field Emmision Cathode], first seen in their <inser name of first FESEM here>.
+
+== Types ==
+----
+=== Transmission Electron Microscope ===
+The [[Transmission Electron Microscope]] was the first type of Electron Microscope invented. Its opperating principle is analegous to that of the [[Compound Light Microscope]] but (usually) in a invetered fassion, relative to their Light Optical Breatheren. The source of Illumination here, is a [[Cathode]] located within the [[Electron Gun]]. The resulting stream of Electrons is demagnified and or Re-Focused onto the Sample. The transmitted Eelectrons are then focused by the Objective lens, and the subsequent real images Magnified by the intermediat and or Projector Lens. The final highly magnified image is then projected onto a Scintilating material or [[Phosphor]] which converts the Electrons into Photons.
+
+Images may be obtained by either directly immaging the Electrons via [[Electron Sensetive Film]], a second fine grane Screen coupled to a Digital or Analog Camera, or alternativly by means of a Externally mounted Camera focused onto either the Focusing Screen, or Viewing Screen via either the Primary or Secondary Viewport.
+
+=== Reflection Electron Microscope ===
+The [[Reflection Electron Microscope]] is a seldom seen variant of the Electron Microscope, which unlike the [[Transmission Electron Microscope]] uses the electrons which the subject under observation reflected in the general direction of the Objective Lens. These electrons are either Inelastically or Elastically Scattered by the Atoms composing the subject.
+
+The general beam path is identical to that of the Transmission Electron Microscope, with the only difference beeing a steep angle between the electron source, Subject and Objetive. Some Transmission Electron Microscopes offer the ability to do Reflection Electron Microscopy all be it at shallow angles, when compared to purpose built machines.
+
+The REM (Reflection Electron Microscope) was the first methode for studiying the native surface of objects at magnifications and Depth of Fields unatanable by classical Light Optical means. The resolution proved to be limmited by the very broud energy spread of the Reflected Electrons. This leads to very a dramatic loss in resolution due to Chromatic Abboration present in all simple [[Electron Lenses]].
+
+=== Scanning Electron Microscope ===
+The [[Scanning Electron Microscope]] was first invented by german Physicist [https://en.wikipedia.org/wiki/Manfred_von_Ardenne Manfred Baron von Ardenne] around 1940. Unlike the two previously discussed types, this Microscope relies not on the focusing of a compleate image onto a [[View Screen]], but rather by means of a sharply focused Electron Probe which is moved accross the Subject.
+
+Various interactions with the Subject can be used for the creation of images, examples include among others, [[Secondary Electron Imaging]], [[Backscatter Electron Imaging]] and Transmitted Electrons. Due to the nature of their image formation, their ultimate resolution is somewhat less then that of the [[Transmission Electron Microscope]].
+
+=== Emission Election Microscope ===
+This [[Emission Electron Microscope]] represents a somewhat obscure form of the Electron Microscope. It uses the same basic imaging train as the [[Transmission Electron Microscope]], but rather then bombarding the Subject with Electrons generated in an [[Electron Gun]], the subject its self is made to give off electrons.
+
+The simplest form of the EEM is the experiment of projecting an image of the Electron Source of either a TEM or a Cathode Ray Tube onto a view Screen or Phosphor. Image contrast is formed by the variation Emmision density of the subject.
+
+Samples may be made to release electrions, which must be further accelerated by a ||Electron Gun]] or a [[Linear Accelerator]] prior to entering the Objective Lens (if prsent), by means of Heat, Ion Bombardment, Electron Bombardment, or Light Bombardment (such as high energy UV Light).