From Electronen Mikroskopie Museum Nürnberg
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Tesla (now TESCAN) is one of the world's leading manufacturers of Scanning Electron Microscopes (SEM) and Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM). TESCAN is located in Brno (Czech Republic), which is considered to be the cradle of electron microscopy in Europe.
Transmission Electron Microsocpes
BS 242E
General
Year
Successor
Unkown
Magnification Range
1000x - 30Kx, 10 steps
Magnification Gauge Type
Specemin Chamber Pressure
Power Consumption
850VA
System Weight
130 lbs (column)+ 180lbs (psu)
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage
40 KV, (60 KV Optional)
Stability
Cathode Heating Methode
HF
Alignment Methode
Mechanical
Condensor
Number of Condensor Lenses
0
Stability
N/A
Stigmator
N/A
Minimum Spot Size Diameter
N/A
Condensor Alignment
N/A
Lens Type
N/A
Stage
Holder Type
Top Entery Cartridge
X, Y Travel Range
Objective Lens
Focal Length
3 mm
Adjustment Range
Spherical Error
Stability
Stigmator
Alignment Aids
Point Resolution
25 Å
Lens Type
Electromagnetic
Projective Lens
Number of Projective Lens
3
Stability
Polpeace Configuration
Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type
BS 513A
General
Year
Successor
Unkown
Magnification Range
300x, 2500x - 250Kx in 12 steps
Magnification Gauge Type
Specemin Chamber Pressure
Power Consumption
4 KVA
System Weight
730 lbs (column), 250lbs (Powersupply)
Electrion Source
Accelerator Type
Cathode Type
Accelerating Voltage
50, 80, 100 KV
Stability
Cathode Heating Methode
Alignment Methode
Condensor
Number of Condensor Lenses
2
Stability
Stigmator
quadropol
Minimum Spot Size Diameter
Condensor Alignment
Mechanical
Lens Type
Stage
Holder Type
Top Entery Cartridge
X, Y Travel Range
Objective Lens
Focal Length
Adjustment Range
Spherical Error
Stability
Stigmator
Alignment Aids
Point Resolution
4.5 Å
Lens Type
Electromagnetic
Projective Lens
Number of Projective Lens
2
Stability
Polpeace Configuration
Single Polpiece
Avalible Polpeace Magnification(s)
Alignment
Lens Type
Scanning Electron Microscopes
BS 343
General
Year
Successor
[[]]
Magnification Range
10x - 50Kx
Magnification Gauge Type
Specemin Chamber Pressure
< 6e-4 mBar
Power Consumption
1.5 KVA
System Weight
Electrion Source
Accelerator Type
Self Biased Triode Gun
Cathode Type
Tungsten Hairpin
Accelerating Voltage
15 KV
Stability
Cathode Heating Methode
Alignment Methode
Electromagnetic
Condensor
Number of Condensor Lenses
2
Current Stability
Stigmator
Aperture
Condensor Alignment
Lens Type
Electromagnetic
Stage
Stage Type
Suction Cup
Specimen Loading
Sample Holder Type
3.2 mm Stub / Suction Cup
X, Y Travel Range
Z Travel Range
Tilt Range
Rotation Range
Drive Mechanism
Micrometer Screw (Hand Operated)
Objective Lens
Working Distance
Spherical Error
Current Stability
Stigmator
Octopol
Deflection Type
Double Deflection Electromagnetic
Point Resolution
16 nm
Lens Type
Electromagnetic